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Although it is possible to use this test mask to evaluate transcription of defects etc
This Specification covers the special requirements for a metal strip to be used to fabricate integrated circuit leadframes by stamping
but these are outside the scope of this Test Method
and Korean
G03800 - SEMI G38 - 静止空気および強制風冷によるICパッケージのジャンクション部周囲間の熱抵抗の測定法 StdVol-Gases Although it is possible toglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1987200411 : IC Referenced SEMI Standards SEMI G32 Guideline for Unencapsulated Thermal Test Chip SEMI G42 Specification for Thermal Test Board Standardization for Measuring Junction to Ambient Thermal Resistance of Semiconductor Packages
